Speaker: Guido Groeseneken, Imec
Location: 34-401 (Grier Room)
Open to: MTL Community
Abstract: Reliability has become one of the bottlenecks in the future downscaling of CMOS technologies. This presentation will highlight the importance of reliability and the impact of scaling, review the historical evolution of reliability assessment and discuss some of the recent trends in the reliability performance of novel devices like SiGe and IIIV devices, FinFET’s, GAA nanowires etc. Also the growing importance of time dependent variability and related stochastic nature behavior of failures will be highlighted, leading to the need for a shift in reliability assurance in the future.
Bio: Guido Groeseneken holds a PhD degree in Electrical Engineering from KU Leuven, Belgium. He is IEEE Fellow, research fellow at imec and part time professor at KU Leuven. He is also Director of the Doctoral program and of Academic relations at imec. He was the recipient of the 2017 IEEE Cledo Brunetti award for his contributions to the characterization and understanding of the reliability physics of advanced MOSFET nanodevice.