From left to right: Cathy Christiansen from Global Foundries (Workshops Chair), Alex Guo, Elyse Rosenbaum from University of Illinois (Vice General Chair).
Ph.D. graduate Alex Guo received the 2016 IEEE International Reliability Physics Symposium (IRPS) Best Student Paper Award at the 2017 IRPS which took place in Monterey, CA on April 3-6, 2017. Her presentation titled "Negative-Bias Temperature Instability of GaN MOSFETs" underwent rigorous peer review and was selected by a review committee among ~70 student presentations. This research was performed in the Xtreme transistor group at MTL, and Alex was advised by Professor Jesus del Alamo. Alex graduated in the Fall of 2016 and is now with McKinsey and Co.