Bias Temperature Instability (BTI) in GaN MOSFETs

EECS Doctoral Dissertations
Alex Guo, MIT


Speaker Photo
Alex Guo holds a PhD in the Electrical Engineering from MIT. She received her B.S. with honors from UC Berkeley in 2010 and S.M. from MIT in 2012, both in Electrical Engineering and Computer Science. Alex works for Prof. del Alamo in the Microsystems Technology Laboratories at MIT. Her research has focused on the bias-temperature instabilities and other reliability issues in GaN power electronics.